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MEM - Machine Efficiency Monitor
microIOC Development Environment
MEM - Machine Efficiency Monitor
Are we running at optimal efficiency?
To have optimal machine efficiency and large beam lifetime it is important to know the beam current, efficiency of the transfer lines and beam losses at different parts of the machine. Machine Efficiency Monitor (MEM) is a turn-key system that provides real time measurements of all the above mentioned parameters.

The system consists of the following components:

  • Bergoz BCMs are used to measure beam charge at the start and end of two transfer lines.

  • Bergoz NPCTs measuring beam current in booster and storage ring.

  • A microIOC-BLM system.

  • A microIOC for processing BCM and NPCT data.


The number of detectors is not fixed, but can be customized to a particular machine.

Operation principle

  • The difference in the measured total beam charge at the start and end of every transfer line gives the efficiency of the transfer line.

  • From the current circulating before and after injection and the beam charge in the transfer line, injection and extraction efficiency is determined.

  • Rate of current decrease in the ring is used to determine lifetime.

  • BLM detectors are used to measure beam loss at different positions and machine configurations to find optimal machine parameters.


Key features
  • A proven solution with easy installation.
  • Dedicated EPICS control software.
  • Open system for easy hardware and software upgrade.
  • No license fees to third parties.

Benefits
  • Optimal machine performance can be achieved.
  • Deviations from optimal machine performance are rapidly observed.
  • Easy troubleshooting in case of increased beam loss.
  • Low beam loss, thus protecting the environment and equipment from radiation damage.

  • Optimizing injection and extraction scheme.
  • Optimizing beam life time in the storage ring.
  • Minimizing irregular uncontrolled losses to protect the environment and equipment from radiation damage.
  •  
  • Monitoring machine performance.
  • Locate any kind of vacuum chamber obstruction from RF-fingers down to different vacuum problems.
  • Precise energy calibration of the beam is possible as Touschek loss increases at beam depolarization.
  • The combination of a scraper and a BLM offers useful applications for beam lifetime studies, e.g. ground motion observation, beam diffusion measurements and tail scans.



www.bergoz.com

use case MEM
Estimate for a typical MEM system269970 EUR
parametervalue
Linac to Booster transfer line28600 EUR
2 Bergoz ICT2 x 6000 EUR
2 Bergoz BCM-IHR-E2 x 8300 EUR
Booster50590 EUR
Bergoz NPCT2700 EUR
24 Bergoz BLM detectors24 x 390 EUR
12 Cosylab BSC (BLM electronics)12 x 970 EUR
microIOC-cosyIcon2590 EUR
Booster to Storage Ring transfer line28600 EUR
2 Bergoz ICT2 x 6000 EUR
2 Bergoz BCM-IHR-E2 x 8300 EUR
Storage Ring126180 EUR
Bergoz NPCT high res.37000 EUR
96 Bergoz BLM detectors96 x 390 EUR
48 Cosylab BSC (BLM electronics)48 x 970 EUR
2 microIOC-cosyIcon2 x  2590 EUR
Control system8000 EUR
microIOC-BCM4000 EUR
microIOC-NPCT4000 EUR
Customizations and installation18000 EUR
Cabling10000 EUR


microIOC is manufactured by Cosylab
 
microIOC M-Box-PMAC
One box solution for your motion control system
robust, flexible and safe – no additional circuitry needed Specially designed electronic interface leverages PMAC’s functionality providing:
Downloads
microIOC-PD-MEM
microIOC-PD-MEM

If you have any questions about our products or services please contact us:

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